Chen, S., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S., Hou, L., & Dodd, B. G.. (1998). A comparison of maximum likelihood estimation and expected a posteriori estimation in CAT using the partial credit model. Educational and Psychological Measurement, 58, 569-595.

Chen, S., Hou, L., Fitzpatrick, S. J., & Dodd, B.. (1997). The effect of population distribution and methods of theta estimation on computerized adaptive testing (CAT) using the rating scale model. Educational and Psychological Measurement, 57, 422-439.

Chen, S., Ankenmann, R. D., & Spray, J. A.. (2003). The relationship between item exposure and test overlap in computerized adaptive testing. Journal of Educational Measurement, 40, 129-145.

Chen, S., Hou, L., Fitzpatrick, S. J., & Dodd, B. G.. (1995). The effect of population distribution and methods of theta estimation on CAT using the rating scale model. In Paper presented at the annual meeting of the American Educational Research Association. San Francisco.

Chen, S., Ankenmann, R. D., & Spray, J. A.. (1999). Exploring the relationship between item exposure rate and test overlap rate in computerized adaptive testing. Paper presented at the annual meeting of the National Council on Measurement in Education, Montreal, Canada.