01922nas a2200217   4500008004100000020004100041245009100082210006900173250001500242260000800257300001100265490000700276520119200283653004001475653002701515653001101542100001401553700001301567700001401580856011001594       2008                        eng d  a0007-1102 (Print)0007-1102 (Linking)00aControlling item exposure and test overlap on the fly in computerized adaptive testing0 aControlling item exposure and test overlap on the fly in compute  a2007/07/26  cNov  a471-920 v613 aThis paper proposes an on-line version of the Sympson and Hetter procedure with test overlap control (SHT) that can provide item exposure control at both the item and test levels on the fly without iterative simulations. The on-line procedure is similar to the SHT procedure in that exposure parameters are used for simultaneous control of item exposure rates and test overlap rate. The exposure parameters for the on-line procedure, however, are updated sequentially on the fly, rather than through iterative simulations conducted prior to operational computerized adaptive tests (CATs). Unlike the SHT procedure, the on-line version can control item exposure rate and test overlap rate without time-consuming iterative simulations even when item pools or examinee populations have been changed. Moreover, the on-line procedure was found to perform better than the SHT procedure in controlling item exposure and test overlap for examinees who take tests earlier. Compared with two other on-line alternatives, this proposed on-line method provided the best all-around test security control. Thus, it would be an efficient procedure for controlling item exposure and test overlap in CATs.10a*Decision Making, Computer-Assisted10a*Models, Psychological10aHumans1 aChen, S-Y1 aLei, P W1 aLiao, W H  uhttp://www.iacat.org/content/controlling-item-exposure-and-test-overlap-fly-computerized-adaptive-testing01947nas a2200277   4500008004100000020004100041245007300082210006900155250001500224260000800239300001000247490000700257520099700264653001601261653002901277653004801306653006201354653001101416653002401427653004601451653003101497653001301528100001401541700001501555856009901570       2008                        eng d  a0007-1102 (Print)0007-1102 (Linking)00aPredicting item exposure parameters in computerized adaptive testing0 aPredicting item exposure parameters in computerized adaptive tes  a2008/05/17  cMay  a75-910 v613 aThe purpose of this study is to find a formula that describes the relationship between item exposure parameters and item parameters in computerized adaptive tests by using genetic programming (GP) - a biologically inspired artificial intelligence technique. Based on the formula, item exposure parameters for new parallel item pools can be predicted without conducting additional iterative simulations. Results show that an interesting formula between item exposure parameters and item parameters in a pool can be found by using GP. The item exposure parameters predicted based on the found formula were close to those observed from the Sympson and Hetter (1985) procedure and performed well in controlling item exposure rates. Similar results were observed for the Stocking and Lewis (1998) multinomial model for item selection and the Sympson and Hetter procedure with content balancing. The proposed GP approach has provided a knowledge-based solution for finding item exposure parameters.10a*Algorithms10a*Artificial Intelligence10aAptitude Tests/*statistics & numerical data10aDiagnosis, Computer-Assisted/*statistics & numerical data10aHumans10aModels, Statistical10aPsychometrics/statistics & numerical data10aReproducibility of Results10aSoftware1 aChen, S-Y1 aDoong, S H  uhttp://www.iacat.org/content/predicting-item-exposure-parameters-computerized-adaptive-testing01801nas a2200241   4500008004100000245009300041210006900134300001200203490000700215520098200222653001801204653002101222653003001243653001901273653004601292653001801338653002501356653001501381100001401396700001901410700001501429856011501444       2003                        eng d00aThe relationship between item exposure and test overlap in computerized adaptive testing0 arelationship between item exposure and test overlap in computeri  a129-1450 v403 aThe purpose of this article is to present an analytical derivation for the mathematical form of an average between-test overlap index as a function of the item exposure index, for fixed-length computerized adaptive tests (CATs). This algebraic relationship is used to investigate the simultaneous control of item exposure at both the item and test levels. The results indicate that, in fixed-length CATs, control of the average between-test overlap is achieved via the mean and variance of the item exposure rates of the items that constitute the CAT item pool. The mean of the item exposure rates is easily manipulated. Control over the variance of the item exposure rates can be achieved via the maximum item exposure rate (r-sub(max)). Therefore, item exposure control methods which implement a specification of r-sub(max) (e.g., J. B. Sympson and R. D. Hetter, 1985) provide the most direct control at both the item and test levels. (PsycINFO Database Record (c) 2005 APA )10a(Statistical)10aAdaptive Testing10aComputer Assisted Testing10aHuman Computer10aInteraction computerized adaptive testing10aItem Analysis10aItem Analysis (Test)10aTest Items1 aChen, S-Y1 aAnkenmann, R D1 aSpray, J A  uhttp://www.iacat.org/content/relationship-between-item-exposure-and-test-overlap-computerized-adaptive-testing