01320nas a2200133   4500008003900000245008000039210006900119300001200188490000700200520089100207100001901098700001601117856005301133       2005                          d00aControlling Item Exposure and Test Overlap in Computerized Adaptive Testing0 aControlling Item Exposure and Test Overlap in Computerized Adapt  a204-2170 v293 a<p>This article proposes an item exposure control method, which is the extension of the Sympson and Hetter procedure and can provide item exposure control at both the item and test levels. Item exposure rate and test overlap rate are two indices commonly used to track item exposure in computerized adaptive tests. By considering both indices, item exposure can be monitored at both the item and test levels. To control the item exposure rate and test overlap rate simultaneously, the modified procedure attempted to control not only the maximum value but also the variance of item exposure rates. Results indicated that the item exposure rate and test overlap rate could be controlled simultaneously by implementing the modified procedure. Item exposure control was improved and precision of trait estimation decreased when a prespecified maximum test overlap rate was stringent.</p>
1 aChen, Shu-Ying1 aLei, Pui-Wa  uhttp://apm.sagepub.com/content/29/3/204.abstract