@article {281,
	title = {The use of person-fit statistics in computerized adaptive testing},
	year = {2005},
	month = {September, 2005},
	institution = {Law School Administration Council},
	address = {Newton, PA. USA},
	isbn = {Computerized Testing Report 97-14},
	author = {Meijer, R. R. and van Krimpen-Stoop, E. M. L. A.}
}
@article {407,
	title = {Using response times to detect aberrant responses in computerized adaptive testing},
	journal = {Psychometrika},
	volume = {68},
	number = {2},
	year = {2003},
	pages = {251-265},
	abstract = {A lognormal model for response times is used to check response times for aberrances in examinee behavior on computerized adaptive tests. Both classical procedures and Bayesian posterior predictive checks are presented. For a fixed examinee, responses and response times are independent; checks based on response times offer thus information independent of the results of checks on response patterns. Empirical examples of the use of classical and Bayesian checks for detecting two different types of aberrances in response times are presented. The detection rates for the Bayesian checks outperformed those for the classical checks, but at the cost of higher false-alarm rates. A guideline for the choice between the two types of checks is offered.},
	keywords = {Adaptive Testing, Behavior, Computer Assisted Testing, computerized adaptive testing, Models, person Fit, Prediction, Reaction Time},
	author = {van der Linden, W. J. and van Krimpen-Stoop, E. M. L. A.}
}
@conference {1212,
	title = {Using response times to detect aberrant behavior in computerized adaptive testing},
	booktitle = {Paper presented at the annual meeting of the National Council on Measurement in Education},
	year = {2001},
	address = {Seattle WA},
	author = {van der Linden, W. J. and van Krimpen-Stoop, E. M. L. A.}
}
@booklet {1538,
	title = {Using response times to detect aberrant behavior in computerized adaptive testing (Research Report 00-09)},
	year = {2000},
	address = {Enschede, The Netherlands: University of Twente, Faculty of Educational Science and Technology, Department of Measurement and Data Analysis},
	author = {van der Linden, W. J. and van Krimpen-Stoop, E. M. L. A.}
}
